Wei Huang received the M.S. degree in Reliability & Quality Engineering, and the Ph.D. degree in Systems & Industrial Engineering from the University of Arizona, USA, in 1998, and 2002, respectively; and the B.S., M.S., and Ph.D. degrees in Mechanical Engineering from Nanjing University of Science and Technology, P. R. China in 1982, 1985, and 1988, respectively. He has been a Senior Engineering Specialist at Space Systems/Loral, Palo Alto, CA, USA since 2007. Before joining SS/L, he was a Reliability/FA Staff Engineer at Seagate Technology, Longmont, CO, USA in 2003–2007; a Member of Technical Staff at Onix Microsystems, Richmond, CA, USA in 2000–2002; and a Senior Electronic Quality & Reliability Engineer at GE Corporate Research & Development, Schenectady, NY, USA in 1999-2000. He was an Associate Professor at the Department of Mechanical Engineering, Nanjing University of Science & Technology, Nanjing, P. R. China in 1988-1996. His current research interests center on reliability modeling of complex redundant systems, degradation reliability modeling, small sample size test planning, and design of sophisticated electronic-mechanical systems (e.g., MEMS), etc.
Overview of Reliability Engineering (可靠性工程回顾)
Wei Huang received the M.S. degree in Reliability & Quality Engineering, and the Ph.D. degree in Systems & Industrial Engineering from the University of Arizona, USA, in 1998, and 2002, respectively; and the B.S., M.S., and Ph.D. degrees in Mechanical Engineering from Nanjing University of Science and Technology, P. R. China in 1982, 1985, and 1988, respectively. He has been a Senior Engi...read more
This seminar session provides an overview of major aspects of reliability engineering, including general introduction of reliability engineering (definition of reliability, function of reliability engineering, a brief history of reliability, etc.), reliability basics (metrics used in reliability, commonly-used probability distributions in reliability, bathtub curve, reliability demonstration test planning, confidence intervals, Bayesian statistics application in reliability, strength-stress interference theory, etc.), accelerated life testing (ALT) (types of ALT, Arrhenius model, inverse power law model, Eyring model, temperature-humidity model, etc.), reliability growth (reliability-based growth models, MTBF-based growth model, etc.), systems reliability & availability (reliability block diagram, non-repairable or repairable systems, reliability modeling of series systems, parallel systems, standby systems, and complex systems, load sharing reliability, reliability allocation, system availability, Monte Carlo simulation, etc.), and degradation-based reliability (introduction of degradation-based reliability, difference between traditional reliability and degradation-based reliability, etc.).
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