Reliability Evaluation using Degradation Data (利用退化数据进行可靠性分析)

Huairui Guo
Dr. Huairui (Harry) Guo is the Director of the Theoretical Development Department at ReliaSoft Corporation. He received his Ph.D. in Systems & Industrial Engineering and M.S. in Reliability & Quality engineering; both from the University of Arizona. His research and publications cover reliability areas, such as life data analysis, repairable system modeling and reliability test planning, more


With components becoming more and more reliable, it is harder to obtain failures through in house testing even at elevated stresses. Most failures are caused by degradation of materials and devices. For reliability evaluation purposes, it is important to investigate how critical material parameters and performance characteristics degradation with time. If a model describing the degradation process very well can be found, then this model can be used to evaluate the product reliability without waiting actual failures to occur. In many engineering applications, this approach provides significant savings in time and costs. In this seminar, we will discuss some practical approaches to degradation data modeling. Topics include the follows: pseudo failure time method, random process method, degradation processes with initiation time, and destructive degradation.

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