Field Failure Analysis Using Root Cause Pattern Diagrams

Bob Lloyd
Bob Lloyd is president of Lloyd Consulting Group, Inc., an international Performance Excellence firm using Six Sigma, Shainin Methods and Lean in product and transactional applications. In 1981, Bob led a team of engineers at Motorola in breaking the Japanese trade barrier in electronics. Using Shainin methods, they reduced failure rates from 2%/mo (36K hrs MTBF) to 0.35%/mo (208K hrs MTBF) to more


To effectively analyze issue root causes, it is crucial that evidence is properly collected, coded, filtered and analyzed. This presentation will outline proper data gathering and organizing techniques. It will examine various analysis methods, comparing their relative strengths and weaknesses. Lastly, it will introduce Root Cause Pattern Diagrams, a breakthrough analysis technique that displays data in colored graphical patterns that are compared against a library of known root cause patterns.Learning Objectives:An understanding of proper data collection, coding, filtering and analysis techniquesA comparison of analysis techniques and their relative strengths and weaknessesAn introduction to the breakthrough analysis technique of Root Cause Pattern Diagrams

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