Pitfalls of Accelerated Tests

Bill Meeker
William Meeker is Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He is a Fellow of the American Statistical Association (ASA) and the American Society for Quality (ASQ) and a past Editor of Technometrics. He is co-author of the books Statistical Methods for Reliability Data with Luis Escobar (1998), and Statistical Intervals with Gerald H...read more


Due to recording issues no video is available. As product development cycles become shorter, and companies demand more rapid achievement of reliability goals, it is becoming more and more important to use quantitative Accelerated Tests to predict and improve reliability. Today there is an abundance of methods to plan and analyze accelerated tests, but there are also many pitfalls. The July 2013 Journal of Quality Technology paper by Meeker, Sarakakis, and Gerokostopoulos outlined 18 pitfalls, adding to 9 pitfalls that had been described in an earlier paper by Meeker and Escobar (1998) in IEEE Transactions on Reliability. These papers identify some major problems and concerns in conducting and interpreting the results of accelerated tests. This talk will present a number of particular case studies that illustrate some of these pitfalls, the ensuing problems that resulted, and for some of the applications, particular remedies or corrections that were implemented.


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